Head of Software EUV Metrology | Informatiker (m/w/d)

Job Summary

This leadership role involves overseeing all development projects and technology studies within the Software EUV Metrology department at ZEISS, a leader in semiconductor manufacturing technology. The successful candidate will lead and manage a team responsible for developing complex measurement systems and modules for photomask inspection in the semiconductor industry, focusing on software architecture, application software, system control, and automation. Key responsibilities include disciplinary and technical leadership, strategic roadmap development, ensuring process conformity, and managing resource planning and KPIs. This position offers the chance to significantly contribute to the advancement of micro- and nanoelectronics by enabling the creation of smaller, more powerful, and energy-efficient microchips.