Scientist Thin Film Metrology | Wissenschaftler Schichtmesstechnik (m/w/d) 1107-586

Job Summary

This role involves developing high-precision metrology for optical layers on EUV mirrors within an interdisciplinary team. The successful candidate will conceptualize, derive requirements for, and implement new solutions in measurement processes and algorithms. A key part of the job is acting as an expert in image data analysis to optimize measurement procedures, conducting experiments, and performing extensive data analysis to verify ideas and prove measurement capabilities. Additionally, the scientist will leverage their expertise to support production in resolving complex issues. This position is ideal for an innovative individual seeking to contribute to a market-leading company with excellent development opportunities, a transparent culture, and flexible work models.